Sandra Wright and R.C.Barklie, Electron paramagnetic resonance characterization of defects in monoclinic HfO2 and ZrO2 powders , Journal of Applied Physics, 106, 2009, p103917-1 - 103917-15,
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R.C.Barklie and Sandra Wright, Electron paramagnetic resonance characterization of defects in HfO2 and ZrO2 powders and films, Journal of Vacuum Science and Technology B: Microelectronics and Nanometre structures, 27, (1), 2009, p317 - 320,
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L.McGuigan, R.C.Barklie, R.G.S.Sofin,S.K.Arora, I.V.Shvets, In-plane magnetic anisotropies in Fe3O4 films on vicinal MgO (100), Physical Review B, 77, 2008, p174424-1 - 174424-9,
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K.Cherkaoui,S.Monaghan,M.A.Negara,M.Modreanu,P.K.Hurley,D.O`Connell,S.McDonnell,G.Hughes,S.Wright,R.C.Barklie,P.Bailey,T.C.Q.Noakes, Electrical,structural and chemical properties of HfO2 films formed by electron beam evaporation, Journal of Applied Physics, 104, 2008, p064113-1 - 064113-10,
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B.J.Jones,S.Wright,R.C.Barklie,J.Tyas,J.Franks,A.J.Reynolds, Nanostructure and paramagnetic centres in diamond-like carbon ; Effect of Ar dilution in PECVD process, Diamond and Related Materials, 17, 2008, p1629 - 1632,
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Sandra Wright,S.Feeney and R.C.Barklie, EPR study of defects in as-received, gamma -irradiated and annealed monoclinic HfO2 powder , Microelectronic Engineering, 84, 2007, p2378 - 2381,
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Sandra Wright and R.C.Barklie, EPR characterisation of defects in m-HfO2, Journal of Material Science:Materials in Electronics, 18, 2007, p743 - 746,
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Sandra Wright and R.C.Barklie, EPR characterisation of defects in monoclinic powders of ZrO2 and HfO2, Materials Science in Semiconductor Processing, 9, 2006, p892 - 896,
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B.J.Jones ,R.C.Barklie, Analysis of defects at the interface between high-k thin films and (100) silicon, Microelectronic Engineering, 80, 2005, p74 - 77,
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B.J.Jones,R.C.Barklie, Electron paramagnetic resonance evaluation of defects at the (100)Si/Al2O3 interface, Journal of Physics D:Applied Physics, 38, 2005, p1178 - 1181,
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