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Gabbett, C. and Doolan, L. and Synnatschke, K. and Gambini, L. and Coleman, E. and Kelly, A.G. and Liu, S. and Caffrey, E. and Munuera, J. and Murphy, C. and Sanvito, S. and Jones, L. and Coleman, J.N., Quantitative analysis of printed nanostructured networks using high-resolution 3D FIB-SEM nanotomography, Nature Communications, 15, (1), 2024,
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Nordahl, Gregory and Jones, Lewys and Christiansen, Emil Frang and Hunnestad, Kasper Aas and Nord, Magnus, Correcting for probe wandering by precession path segmentation, Ultramicroscopy, 248, 2023, p113715-,
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Peters, J.J.P. and Mullarkey, T. and Hedley, E. and MÃŒller, K.H. and Porter, A. and Mostaed, A. and Jones, L., Electron counting detectors in scanning transmission electron microscopy via hardware signal processing, Nature Communications, 14, (1), 2023,
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Mullarkey, T. and Geever, M. and Peters, J.J.P. and Griffiths, I. and Nellist, P.D. and Jones, L., How Fast is Your Detector? The Effect of Temporal Response on Image Quality, Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29, (4), 2023, p1402-1408 ,
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Bekkevold, J.M. and Peters, J.J.P. and Mullarkey, T. and Jones, L., Retrofitting and Reconfiguring Existing Microscopes for Digital DPC: an Accessible Approach to Low-Dose Phase Mapping, Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29, (1), 2023, p1878-1879 ,
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Peters, J.J.P. and Reed, B.W. and Jimbo, Y. and Porter, A. and Masiel, D. and Jones, L., A New Low-dose STEM Imaging Mode with Probability Driven Intra-pixel Beam Blanking, Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29, (1), 2023, p1754-1755 ,
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McBean, P. and Alves, G.M. and Thompson, F. and Sagawa, R. and Jones, L., Progress Update on the Development of a User Adjustable Pole-piece, Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29, (1), 2023, p1885-1886 ,
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Conroy, M.S. and O'Connell, E. and Moore, K. and Jones, L. and Ramasse, Q. and Griffin, S. and Ophus, C., Probing the Atomic-Scale Internal Phases with the Electron Beam of Mutliferroic Domain Walls Formed During Dynamics, Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, 29, (1), 2023, p1363 ,
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Gambini, L. and Mullarkey, T. and Jones, L. and Sanvito, S., Machine-learning approach for quantified resolvability enhancement of low-dose STEM data, Machine Learning: Science and Technology, 4, (1), 2023,
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Quigley, F. and Downing, C. and McGuinness, C. and Jones, L., A Retrofittable Photoelectron Gun for Low-Voltage Imaging Applications in the Scanning Electron Microscope, Microscopy and Microanalysis, 29, (5), 2023, p1610-1617 ,
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