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Dr. Hongzhou Zhang

Associate Professor (Physics)

Dr Hongzhou Zhang received a BSc degree and an MSc degree in physics from Peking University (China) and a PhD in applied physics from Rice University (USA). From 2002 to 2004 he had a post-doctoral position at the National Laboratory of Mesoscopic Physics and Electron Microscopy (Peking University, China), where he conducted research into the application of electron microscopy to one-dimensional nanostructures. In 2004 he became a research fellow of the Electronic Materials Engineering Department at the Australian National University (Australia). During this period, he synthesized and characterized BN nanostructures. In 2009 he moved to Dublin and joined CRANN as a Principal Investigator and holds a Stokes Lecturer position in the School of Physics, Trinity College Dublin
  Applied physics   Crystallography   ELECTRON ENERGY LOSS SPECTROSCOPY   Electron Microscopy   Helium Ion Microscopy   Materials Sciences   MICROSCOPY   Nanotechnology   Solid State Physics   Surface Physics   Ultrafine Microstructure   Ultramicroscopy
 Helium ion microscopy for graphene devices

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American Vacuum Society
American Microscopy Society
Microscopical Society of Ireland
Insitute of Physics
Jadwiszczak, J. and Li, G. and Cullen, C.P. and Wang, J.J. and Maguire, P. and Duesberg, G.S. and Lunney, J.G. and Zhang, H., Photoresponsivity enhancement in monolayer MoS2 by rapid O2:Ar plasma treatment, Applied Physics Letters, 114, (9), 2019, Notes: [cited By 0], Journal Article, PUBLISHED  DOI
Maguire, P. and Downing, C. and Jadwiszczak, J. and O'Brien, M and Keane, D. and McManus, J. B. and Duesberg, G. S and Nicolosi, V. and McEvoy, N. and Zhang, H., Suppression of the Shear Raman Mode in Defective Bilayer MoS$_2$, Journal of Applied Physics, 125, (6), 2019, p064305 , Journal Article, PUBLISHED  DOI
Jakub Jadwiszczak, Colin O'Callaghan, Yangbo Zhou, Daniel S Fox, Eamonn Weitz, Darragh Keane, Conor P. Cullen, Ian O'Reilly, Clive Downing, Aleksey Shmeliov, Pierce Maguire, John J. Gough , Cormac McGuinness , Mauro S. Ferreira, A. Louise Bradley , John J. Boland, Georg S. Duesberg, Valeria Nicolosi & Hongzhou Zhang, Oxide-mediated self-limiting recovery of field effect mobility in plasma-treated MoS2, Science Advances, 4, (2), 2018, peaao5031-, Journal Article, PUBLISHED  TARA - Full Text  DOI  URL
Baggott, A. and Mazaheri, M. and Zhou, Y. and Zhang, H. and Inkson, B.J., A comparison of He and Ne FIB imaging of cracks in microindented silicon nitride, Materials Characterization, 141, 2018, p362-369 , Notes: [cited By 0], Journal Article, PUBLISHED  DOI
Stehling, N. and Masters, R. and Zhou, Y. and O'Connell, R. and Holland, C. and Zhang, H. and Rodenburg, C., New perspectives on nano-engineering by secondary electron spectroscopy in the helium ion and scanning electron microscope, MRS Communications, 8, (2), 2018, p226-240 , Notes: [cited By 0], Journal Article, PUBLISHED  DOI
Inkielewicz-Stepniak, I. and Tajber, L. and Behan, G. and Zhang, H. and Radomski, M.W. and Medina, C. and Santos-Martinez, M.J., The role of mucin in the toxicological impact of polystyrene nanoparticles, Materials, 11, (5), 2018, p724-, Notes: [cited By 0], Journal Article, PUBLISHED  TARA - Full Text  DOI
Fox, D. and Zhang, H., Helium ion microscopy, Springer Tracts in Modern Physics, 272, 2018, p479-508 , Notes: [cited By 0], Journal Article, PUBLISHED  DOI
Maguire, P. and Fox, D.S. and Zhou, Y. and Wang, Q. and O'Brien, M. and Jadwiszczak, J. and Cullen, C.P. and McManus, J. and Bateman, S. and McEvoy, N. and Duesberg, G.S. and Zhang, H., Defect sizing, separation, and substrate effects in ion-irradiated monolayer two-dimensional materials, Physical Review B, 98, (13), 2018, p134109-, Notes: [cited By 0], Journal Article, PUBLISHED  TARA - Full Text  DOI
Ozhet Mauit, Karsten Fleischer, Cormac Ó Coileáin, Brendan Bulfin, Daniel S. Fox, Christopher M. Smith, Daragh Mullarkey, Gulnar Sugurbekova, Hongzhou Zhang, and Igor V. Shvets, Ultrathin magnetite in Fe3O4/MgO superlattices: Investigating the enhanced thin film magnetic moment, PHYSICAL REVIEW B, 95, 2017, p125128-, Journal Article, PUBLISHED  TARA - Full Text  DOI  URL
O'connell, R. and Chen, Y. and Zhang, H. and Zhou, Y. and Fox, D. and Maguire, P. and Wang, J.J. and Rodenburg, C., Comparative study of image contrast in scanning electron microscope and helium ion microscope, Journal of Microscopy, 268, (3), 2017, p313-320 , Notes: [cited By 1], Journal Article, PUBLISHED  DOI

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Award Date
Stokes Award 2009
SFI PI 2012
Our primary research at Trinity focuses on developing and utilizing ultramicroscopy methodologies such as helion-ion microscopy and electron micrscopy. Specifically, our current research includes electron/helium ion diffraction and imaging, structural defects of magnetic and electronic materials(e.g., interfaces, domain/grain boundaries, stacking faults,...), in-situ microscopy, and e-beam/ion beam etching/depositoin/lithography. The major object is to further understand the interaction between electron/helium ion beam with materials and thus to develop methodologies for material characterization and manipulation. Our research also includes the study of the growth-structure-property relationship of nanostructures by employing ultramicroscopy techniques. This covers the synthesis of nanoscaled crystals, advanced nanoscale composition and structure analysis (scanning electron microscopy, transmission electron microscopy, and electron energy loss spectroscopy etc.), luminescence of nanostructures, and field emission of nanostructures. We have a special interest in experimental study of doping of one-dimensional nanomaterials, in-situ observation of dopant migration and its significance for fabrication and application of novel nanodevices.